Imaging Technology Applied Products: In-situ straining and time-resolved electron tomography data acquisition in a transmission electron microscope

Paper Introduction: In-situ straining and time-resolved electron tomography data acquisition in a transmission electron microscope

In-situ straining and time-resolved electron tomography data acquisition in a transmission electron microscope

Authors (Members in bold)

S. Hata¹, S. Miyazaki^2,3, T. Gondo³, K. Kawamoto⁴, N. Horii⁴, K. Sato⁵, H. Furukawa⁶, H. Kudo^7,8, H. Miyazaki³, and M. Murayama^9,1

¹Department of Electrical and Materials Science and Engineering and The Ultramicroscopy Research Center, ²FEI Company Japan Ltd., ³Mel-Build Corporation, ⁴Engineering Department System in Frontier Inc., ⁵Research Center for Ultra-High Voltage Electron Microscopy, ⁶System in Frontier Inc., ⁷Faculty of Engineering, Information and Systems, ⁸JST-ERATO, Momose Quantum-Beam Phase Imaging Project, ⁹Department of Materials Science and Engineering, Virginia Tech

Published

Microscopy, Volume 66, Issue 2, April 2017, Pages 143‒153,
https://doi.org/10.1093/jmicro/dfw109

Abstract

This paper reports the preliminary results of a new in-situ three-dimensional (3D) imaging system for observing plastic deformation behavior in a transmission electron microscope (TEM) as a directly relevant development of the recently reported straining-and-tomography holder [Sato K et al. (2015) Development of a novel straining holder for transmission electron microscopy compatible with single tilt-axis electron tomography. Microsc. 64: 369‒375]. We designed an integrated system using the holder and newly developed straining and image-acquisition software and then developed an experimental procedure for in-situ straining and time-resolved electron tomography (ET) data acquisition. The software for image acquisition and 3D visualization was developed based on the commercially available ET software TEMographyTM. We achieved time-resolved 3D visualization of nanometer-scale plastic deformation behavior in a Pb-Sn alloy sample, thus demonstrating the capability of this system for potential applications in materials science.

Abstract

This paper reports the preliminary results of a new in-situ three-dimensional (3D) imaging system for observing plastic deformation behavior in a transmission electron microscope (TEM) as a directly relevant development of the recently reported straining-and-tomography holder [Sato K et al. (2015) Development of a novel straining holder for transmission electron microscopy compatible with single tilt-axis electron tomography. Microsc. 64: 369‒375]. We designed an integrated system using the holder and newly developed straining and image-acquisition software and then developed an experimental procedure for in-situ straining and time-resolved electron tomography (ET) data acquisition. The software for image acquisition and 3D visualization was developed based on the commercially available ET software TEMographyTM. We achieved time-resolved 3D visualization of nanometer-scale plastic deformation behavior in a Pb-Sn alloy sample, thus demonstrating the capability of this system for potential applications in materials science.
https://www.youtube.com/watch?v=Ic7zREgSIMU

The following Review papers have also been published as a result of this project.

Title

Electron tomography imaging methods with diffraction contrast for materials research

Authors (Members in bold)

S. Hata, H. Furukawa, Takashi Gondo, Daisuke Hirakami, Noritaka Horii, Ken-Ichi Ikeda, Katsumi Kawamoto, Kosuke Kimura, Syo Matsumura, Masatoshi Mitsuhara, Hiroya Miyazaki, Shinsuke Miyazaki, Mitsu Mitsuhiro Murayama, Hideharu Nakashima, Hikaru Saito, Masashi Sakamoto, and Shigeto Yamasaki

Published

Microscopy, March 2020, Pages 1‒15,
https://doi.org/10.1093/jmicro/dfaa002