Application Notes
Imaging Technology Applied Products: Assessing Experimental Parameter Space for Achieving Quantitative Electron Tomography for Nanometer-Scale Plastic Deformation
Imaging Technology Applied Products : Assessing Experimental Parameter Space for Achieving Quantitative Electron Tomography for Nanometer-Scale Plastic Deformation
Assessing Experimental Parameter Space for Achieving Quantitative Electron Tomography for Nanometer-Scale Plastic Deformation
- Authors (Members in bold)
YA-PENG YU1, HIROMITSU FURUKAWA2, NORITAKA HORII2, and MITSUHIRO MURAYAMA3
1Institute for Critical Technology and Applied Science, Virginia Tech, 2System in Frontier Inc., 3Materials Science and Engineering, Virginia Tech
- Published
- Metallurgical and Materials Transactions A, Volume 51, Number 1, January 2020, Pages 20‒27,
https://doi.org/10.1007/s11661-019-05345-3
- Abstract
- Integrating in situ deformation and electron tomography (ET) techniques allows us to visualize the materials’ response to an applied stress with nanometer spatial resolution. The capability of structural, chemical, and morphological characterization in three-dimension real time and at sub-microscopic levels alleviates several persistent problems of two-dimensional imaging such as the projection effect and postmortem appearance. On the other hand, implementing deformation mechanism introduces additional experimental constraints that could influence the accuracy of the reconstructed volumes in a different way. To materialize quantitative and statistically relevant microstructure interpretation by time-resolved ET, we evaluated several key parameters such as angular tilt range, tilt increment, and reconstruction algorithms to characterize their influences on the accuracy of size and morphology reproducibility.
- Abstract
- Integrating in situ deformation and electron tomography (ET) techniques allows us to visualize the materials’ response to an applied stress with nanometer spatial resolution. The capability of structural, chemical, and morphological characterization in three-dimension real time and at sub-microscopic levels alleviates several persistent problems of two-dimensional imaging such as the projection effect and postmortem appearance. On the other hand, implementing deformation mechanism introduces additional experimental constraints that could influence the accuracy of the reconstructed volumes in a different way. To materialize quantitative and statistically relevant microstructure interpretation by time-resolved ET, we evaluated several key parameters such as angular tilt range, tilt increment, and reconstruction algorithms to characterize their influences on the accuracy of size and morphology reproducibility.
- Title
- Electron tomography imaging methods with diffraction contrast for materials research
- Authors (Members in bold)
X.Y.Wang, R. Lockwood, M. Malac, H. Furukawa, P. Li, A. Meldrum
- Published
ltramicroscopy, Volume 113, February 2012, Pages 96-105
https://doi.org/10.1016/j.ultramic.2011.11.001